Scanning electron microscope JEOL 6300

Fig. 1:    Fully digitized SEM JEOL 6300 equipped with EDX (copyright: IMVT).

The JEOL 6300 scanning electron microscope is used for routine investigations of all issues arising at the institute and especially for samples with larger dimensions. This includes the characterization of microtools (cutting edge geometry and quality of wear protection coatings), microstructures in polymers, metals and ceramics produced by them, as well as the morphology of membranes, catalysts and corrosion protection coatings.

BSE images can be used to visualize local differences in atomic numbers, e.g. in precipitates.